Reliability testThe purpose of reliability test on Siliup products is to find out the weak points, to understand, verify, evaluate, analysis and improve the reliability of products. Different levels of chips will work under different application environments. The more complex the application environment, the requirements on reliability will be higher and stricter. All our products have been tested strictly before shipment to ensure that the products delivered to customers are verified. However, in order to evaluated the performance after working long times, further reliability tests are needed to simulate the impact of some harsh service conditions on the products in actual environment, so as to evaluate the service life and possible risks of the chip and improve the product performance.
Test itemsDifferent grades of products have different requirements. The purpose of reliability test is to prove that they meet the classification standards. The test items of reliability test are designed according to the specific application environment of different levels of products, simulate the environmental factors of products in normal use, and verify their functional consistency and durability.
| 要求 Requirement等级 Rank | 消费级 Consumption grade | 工业级 Industrial grade | 车规级 Automotive grade |
|---|---|---|---|
| 应用 | 手机、PC等 | 工业控制 | 汽车电子 |
| 温度 | 0~70℃ | -40~85℃ | -40~150℃ |
| 湿度 | 中 | 根据环境 | 0~100% |
| 振动/冲击 | 中 | 较高 | 高 |
| 寿命 | 1~3年 | 5-10年 | 15年 |
| 可靠性 | 中 | 较高 | 高 |
| 出错率 | <3% | <1% | 0 |
Consumption grade| 试验类别 Category | 试验项目 Test Contents | 试验条件 Condition | 试验时间 Time | 样品数量 S.S | 判定标准 Acc/Re | 参考标准 Reference |
|---|---|---|---|---|---|---|
| 环境试验 | HTS (高温存储) | Ta=150℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 |
| LTS (低温存储) | Ta=-55℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 | |
| TC (温度循环) | Ta: -65℃ to 150℃ （Ta: -55℃ to 150℃） | 500cycles (1000cycles) | 77Pcs | 0/1 | JESD22-A104 | |
| PCT (压力蒸煮试验) | Ta=121℃，RH=100%, 1atm | 96hrs | 77Pcs | 0/1 | JESD22-A102 | |
| HAST （高加速应力试验） | Ta=130℃，85%RH Vds=80%VdsMax（Max=42V) | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| uHAST （无偏高加速应力试验） | Ta=130℃，85%RH | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| H3TRB (高温高湿反偏) | Ta=85℃，85%RH Vds=80%VdsMax（Max=100V) | 1000hrs | 77Pcs | 0/1 | JESD22-A101 | |
| Precondition (预处理 For SMD only) | Step1: TC: -65℃~150℃ 15min 5cycles Step2: Bake: 125℃ ，24hrs Step3: MSL: 30℃/60%RH ，192hrs Step4: IR: 260℃ ，3cycles | NA | 77Pcs | 0/1 | JESD22A-113 |
Industrial grade| 试验类别 Category | 试验项目 Test Contents | 试验条件 Condition | 试验时间 Time | 样品数量 S.S | 判定标准 Acc/Re | 参考标准 Reference |
|---|---|---|---|---|---|---|
| 寿命试验 | HTGB (高温栅极偏置) | Ta=150℃，Vgs=100%VgsMax | 1000hrs | 77Pcs | 0/1 | JESD22-A108 |
| HTRB (高温反向偏压) | Ta=150℃，Vgs=100%VgsMax | 1000hrs | 77Pcs | 0/1 | JESD22-A108 | |
| 环境试验 | HTS (高温存储) | Ta=150℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 |
| LTS (低温存储) | Ta=-55℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 | |
| TC (温度循环) | Ta: -65℃ to 150℃ （Ta: -55℃ to 150℃） | 500cycles (1000cycles) | 77Pcs | 0/1 | JESD22-A104 | |
| PCT (压力蒸煮试验) | Ta=121℃，RH=100%, 1atm | 96hrs | 77Pcs | 0/1 | JESD22-A102 | |
| HAST （高加速应力试验） | Ta=130℃，85%RH Vds=80%VdsMax（Max=42V) | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| uHAST （无偏高加速应力试验） | Ta=130℃，85%RH | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| H3TRB (高温高湿反偏) | Ta=85℃，85%RH Vds=80%VdsMax（Max=100V) | 1000hrs | 77Pcs | 0/1 | JESD22-A101 | |
| Precondition (预处理 For SMD only) | Step1: TC: -65℃~150℃ 15min 5cycles Step2: Bake: 125℃ ，24hrs Step3: MSL: 30℃/60%RH ，192hrs Step4: IR: 260℃ ，3cycles | NA | 77Pcs | 0/1 | JESD22A-113 |
Automotive grade| 试验类别 Category | 试验项目 Test Contents | 试验条件 Condition | 试验时间 Time | 样品数量 S.S | 判定标准 Acc/Re | 参考标准 Reference |
|---|---|---|---|---|---|---|
| 寿命试验 | HTGB (高温栅极偏置) | Ta=150℃，Vgs=100%VgsMax | 1000hrs | 77Pcs | 0/1 | JESD22-A108 |
| HTRB (高温反向偏压) | Ta=150℃，Vgs=100%VgsMax | 1000hrs | 77Pcs | 0/1 | JESD22-A108 | |
| 环境试验 | HTS (高温存储) | Ta=150℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 |
| LTS (低温存储) | Ta=-55℃ | 1000hrs | 77Pcs | 0/1 | JESD22-A103 | |
| TC (温度循环) | Ta: -65℃ to 150℃ （Ta: -55℃ to 150℃） | 500cycles (1000cycles) | 77Pcs | 0/1 | JESD22-A104 | |
| PCT (压力蒸煮试验) | Ta=121℃，RH=100%, 1atm | 96hrs | 77Pcs | 0/1 | JESD22-A102 | |
| HAST （高加速应力试验） | Ta=130℃，85%RH Vds=80%VdsMax（Max=42V) | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| uHAST （无偏高加速应力试验） | Ta=130℃，85%RH | 96hrs | 77Pcs | 0/1 | JESD22-A110 | |
| H3TRB (高温高湿反偏) | Ta=85℃，85%RH Vds=80%VdsMax（Max=100V) | 1000hrs | 77Pcs | 0/1 | JESD22-A101 | |
| Precondition (预处理 For SMD only) | Step1: TC: -65℃~150℃ 15min 5cycles Step2: Bake: 125℃ ，24hrs Step3: MSL: 85℃/85%RH ，168hrs Step4: IR: 260℃ ，3cycles | NA | 77Pcs | 0/1 | JESD22A-113 |
Shanghai address：Room 1106, Building B, 2305 Zuchongzhi Road, Pudong New Area, ShanghaiHefei address：F1-706, Phase II, Innovation Industrial Park, No.2800, Innovation Avenue, High-tech Zone, Hefei city, Anhui Province
Tel：18217298861 Mr. Gao
Email：gaopp@siliup.com
